SOS MOSFET’s

This publication has 4 references indexed in Scilit:

• Impact ionization current in MOS devices
  Solid-State Electronics, 1973
• Carrier multiplication in the pinchoff region of m.o.s. transistors
  Electronics Letters, 1971
• Charge multiplication in silicon p-n junctions
  Solid-State Electronics, 1963
• Ionization Rates for Electrons and Holes in Silicon
  Physical Review B, 1958