Polymer thickness effects on Bosch etch profiles
- 1 November 2002
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 20 (6) , 2229-2232
- https://doi.org/10.1116/1.1515910
Abstract
Time-multiplexed etching, the Bosch process, is a technique consisting of alternating etch and deposition cycles to produce high aspect-ratio etched features. The Bosch process uses and as etch and polymer deposition gases, respectively. In these experiments, polymer thickness is controlled by both gas flow rates and by deposition cycle time. The authors show that polymer thickness can be used to control wall angle and curvature at the base of feature walls. Wall angle is found to be independent of trench width under thin-polymer deposition conditions. Experimental results are compared to results obtained by other researchers using the more conventional simultaneous etch/deposition technique.
Keywords
This publication has 5 references indexed in Scilit:
- Comparison of Bosch and cryogenic processes for patterning high-aspect-ratio features in siliconPublished by SPIE-Intl Soc Optical Eng ,2001
- Deep-submicron trench profile control using a magnetron enhanced reactive ion etching system for shallow trench isolationJournal of Vacuum Science & Technology A, 1998
- Low-temperature reactive ion etching and microwave plasma etching of siliconApplied Physics Letters, 1988
- Formation of deep holes in silicon by reactive ion etchingJournal of Vacuum Science & Technology B, 1987
- Plasma etching—A discussion of mechanismsJournal of Vacuum Science and Technology, 1979