Diagnostics of Fluorine Negative Ions by Laser Photodetachment Combined with a Heated Probe in High-Density CF 4 Plasmas
- 1 December 1997
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 36 (12B) , L1702
- https://doi.org/10.1143/jjap.36.l1702
Abstract
This paper reports the absolute density and reaction kinetics of fluorine negative ions (F-) in a low-pressure, high-density CF4 plasma excited by helicon-wave discharge. Probe-assisted laser photodetachment has been adopted for the measurement of the F- density. To avoid the deposition of insulated fluorocarbon films on the probe surface, the probe tip was heated to approximately 1000 K. For a CF4 gas pressure of 2 mTorr, the ratio of the F- density to the electron density was n -/n e ≃0.06 in the active discharge plasma with a plasma density of 1.8 ×1012 cm-3. In the afterglow, the electron density decreased rapidly with a decay time constant of ≃10 µs, while the F- density had a peak at ∼15 µs after the termination of the rf power. The ratio n -/n e increased up to ∼5.7 in the afterglow. The production and loss processes of F- are discussed based on the experimental observations.Keywords
This publication has 19 references indexed in Scilit:
- Electron Attachment Mass Spectrometry for the Detection of Electronegative Species in a PlasmaJapanese Journal of Applied Physics, 1997
- Time-of-Flight Mass Spectrometry of Positive Ions in Helicon-Wave Excited High-Density CF 4 and C 4F 8 PlasmasJapanese Journal of Applied Physics, 1997
- Negative ion measurements and etching in a pulsed-power inductively coupled plasma in chlorinePlasma Sources Science and Technology, 1996
- Charge accumulation effects on profile distortion in ECR plasma etchingPlasma Sources Science and Technology, 1996
- Charge-free etching process using positive and negative ions in pulse-time modulated electron cyclotron resonance plasma with low-frequency biasApplied Physics Letters, 1996
- Charge Damage Caused by Electron Shading EffectJapanese Journal of Applied Physics, 1994
- Cyclotron Resonance Mass Spectrometry of Ionic Radicals in Magnetized CF4PlasmaJapanese Journal of Applied Physics, 1994
- Production of Electron-Free Plasma by Using a Magnetic Filter in Radio Frequency DischargeJapanese Journal of Applied Physics, 1991
- Dissociative attachment in HCl, DCl, and F2The Journal of Chemical Physics, 1983
- Electron Photodetachment Cross Section of the Negative Ion of FluorinePhysical Review A, 1971