Oxygen depth profiling in prepared by sol-gel method using 16O(α, α)16O resonant backscattering

This publication has 14 references indexed in Scilit:

• Conventional depth profiling using narrow nuclear resonances
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1996
• Characterization of thin Si1On surface layers on Si by proton and alpha particle backscattering
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1992
• Depth profiling of light-Z elements with elastic resonances: Oxygen profiling with the 3.045 MeV 16O(α, α)16O resonance
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1992
• Oxygen measurements by elastic backscattering
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1992
• Oxygen depth profiling study of copper oxide films on silicon (100) substrates by 16O(α,α)16O resonance
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1990
• High-Energy Ion Beam Analysis of YBa₂Cu₃O_x Thin Films
  Japanese Journal of Applied Physics, 1989
• Methodology and application of the nuclear resonance reaction 16O(α, α)16O for the profiling of titanium oxide
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1988
• The use of the 3.05 MeV oxygen resonance for 4He backscattering near-surface analysis of oxygen-containing high Z compounds
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1988
• Measurement of the oxygen content in high-Tcsuperconductors: Enhanced resonant ion-scattering analysis
  Physical Review B, 1988
• Depth profiling with narrow resonances of nuclear reactions: Theory and experimental use
  Nuclear Instruments and Methods in Physics Research, 1982