Relations between structural and electronic properties of SnO2 polycrystalline thin films prepared by the aerosol MOCVD technique
- 1 July 1995
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 263 (1) , 122-126
- https://doi.org/10.1016/0040-6090(95)06553-9
Abstract
No abstract availableKeywords
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