Cross-sectional transmission electron microscopy of GaAs/InAs(100) strain layer modulated structures grown by molecular beam epitaxy
- 3 August 1986
- journal article
- Published by Elsevier in Surface Science
- Vol. 174 (1-3) , 606-614
- https://doi.org/10.1016/0039-6028(86)90480-2
Abstract
No abstract availableKeywords
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