Exact analytical solution of high frequency lossless MOS capacitance-voltage characteristics and validity of charge analysis
- 23 September 1969
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 12 (9) , 681-688
- https://doi.org/10.1016/0038-1101(69)90064-1
Abstract
No abstract availableKeywords
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