Dual-regulator dual-decoding-trimmer DRAM voltage limiter for burn-in test
- 1 January 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 26 (11) , 1544-1549
- https://doi.org/10.1109/4.98970
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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