High critical current densities of YBa2Cu3O7−x thin films on buffered technical substrates
- 3 February 1997
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 70 (5) , 661-663
- https://doi.org/10.1063/1.118326
Abstract
C -axis oriented YBa2Cu3O7−x (YBCO) thin films were deposited on polycrystalline metallic tapes buffered with yttria stabilized zirconia (YSZ). The in-plane alignment of the YSZ layers achieved by simultaneous ion bombardment of the growing film (ion beam assisted deposition) and of the postdeposited YBCO thin films was studied by x-ray diffraction as a function of the buffer layer thickness. A significant improvement of the in-plane texture, achieved for buffer layers exceeding a thickness of about 1.5 μm, resulted in high critical current densities above 106 A/cm2 of the YBCO films.Keywords
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