Reliability of ultra-thin SOI MOSFET's
- 1 June 1995
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 28 (1-4) , 371-378
- https://doi.org/10.1016/0167-9317(95)00079-n
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Practical reduction of dislocation density in SIMOX wafersElectronics Letters, 1990
- Single-transistor latch in SOI MOSFETsIEEE Electron Device Letters, 1988