Computer simulation of channeling measurements in he-irradiated v3si single crystals
- 1 January 1979
- journal article
- Published by Taylor & Francis in Radiation Effects
- Vol. 40 (3) , 161-166
- https://doi.org/10.1080/00337577908237918
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
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- Channeling inSi: Atomic Displacements and Electron-Phonon/Defect InteractionsPhysical Review Letters, 1977
- Channelling effect measurements of 4He-induced damage in V3Si single crystalsSolid State Communications, 1977
- Comments on Defect Production and Stoichiometry inSuperconductorsPhysical Review Letters, 1976
- Dechanneling measurements of defect depth profiles and effective cross-channel distribution of misaligned atoms in ion-irradiated goldNuclear Instruments and Methods, 1976
- Distribution across the channel of defects induced by nitrogen bombardment in siliconApplied Physics Letters, 1976
- On “measurements” of radiation damage by backscattering experimentsRadiation Effects, 1976
- Ion Implantation in Superconducting Thin FilmsPublished by Springer Nature ,1974
- Dechanneling from 2-MeVDamage in GoldPhysical Review B, 1973
- Defect studies in crystals by means of channelingCanadian Journal of Physics, 1968