A summary of SEU test results using Californium-252
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 35 (6) , 1622-1628
- https://doi.org/10.1109/23.25509
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- An Experimental Study of the Effect of Absorbers on the Let of the Fission Particles Emitted by CF-252IEEE Transactions on Nuclear Science, 1985
- Use of CF-252 to Determine Parameters for SEU Rate CalculationIEEE Transactions on Nuclear Science, 1985
- Trends in Parts Susceptibility to Single Event Upset from Heavy IonsIEEE Transactions on Nuclear Science, 1985
- Use of a 252 Cf source in cosmic ray simulation studies on CMOS memoriesElectronics Letters, 1983
- Cosmic Ray Simulation Experiments for the Study of Single Event Upsets and Latch-Up in CMOS MemoriesIEEE Transactions on Nuclear Science, 1983