Alternating-current thin-film electro-luminescent devices: Effect of fabrication conditions on aging and failure defect formation
- 1 January 1998
- journal article
- Published by Elsevier in Progress in Crystal Growth and Characterization of Materials
- Vol. 37 (2-3) , 123-167
- https://doi.org/10.1016/s0960-8974(99)00003-0
Abstract
No abstract availableKeywords
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