Comparison between analytical models and finite-difference simulations in transmission-line tap resistors and L-type cross-Kelvin resistors
- 1 April 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 37 (4) , 1099-1103
- https://doi.org/10.1109/16.52448
Abstract
No abstract availableKeywords
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