Functional Testing Techniques for Digital LSI/VLSI Systems
- 1 January 1984
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
Functional testing is becomilng more important due to the increasing complexity in digital LSI/VLSI devices. Various functional testing approaches have been proposed to meet this urgent need in LSI/VLSI testing. This paper presents the basic ideas behind deterministic functional testing and concisely overviews eight major functional testing techniques. Comparisons among these techniques and suggestions for future development are made to meet the challenges in this fast growing testing field.Keywords
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