Surface and grain boundary diffusion
- 1 June 1979
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 60 (1) , 27-31
- https://doi.org/10.1016/0040-6090(79)90342-0
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Silicon dioxide as a high temperature stabilizer for silver filmsThin Solid Films, 1977
- Hillock formation by surface diffusion on thin silver filmsSurface Science, 1972
- Hillock Growth on Vacuum Deposited Aluminum FilmsJournal of Vacuum Science and Technology, 1972
- Hillock-free aluminum thin films for electronic devicesMetallurgical Transactions, 1971
- REVERSIBLE HILLOCK GROWTH IN THIN FILMSApplied Physics Letters, 1969
- Pin hole formation in tin films on cryogenically cooled substratesSurface Science, 1969
- Hillock Growth and Stress Relief in Sputtered Au FilmsJournal of Applied Physics, 1969
- Effects of Annealing on Thin Gold FilmsJournal of Applied Physics, 1966
- Amorphous Oxide Layers on Gold and Nickel Films Observed by Electron MicroscopyJournal of Applied Physics, 1964
- Part II.—The structure of metallic coatings. The crystallisation of thin metal filmsTransactions of the Faraday Society, 1935