Extraction of interface state attributes from MOS conductance measurements
- 1 April 1987
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 30 (4) , 433-437
- https://doi.org/10.1016/0038-1101(87)90173-0
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Rapid interface parameterization using a single MOS conductance curveSolid-State Electronics, 1983
- A method to extract interface state parameters from the MIS parallel conductance techniqueSolid-State Electronics, 1973
- Expedient method of obtaining interface state properties from MIS conductance measurementsSolid-State Electronics, 1969