Proton induced X-ray emission (PIXE) analysis on thick samples exemplified on the rare earth elements
- 1 January 1981
- journal article
- research article
- Published by Springer Nature in Analytical and Bioanalytical Chemistry
- Vol. 307 (3) , 185-193
- https://doi.org/10.1007/bf00527484
Abstract
No abstract availableKeywords
This publication has 18 references indexed in Scilit:
- Proton induced X-ray emission (PIXE) analysis on thick samples exemplified on the rare earth elementsAnalytical and Bioanalytical Chemistry, 1981
- Enhancement in PIXE analysisNuclear Instruments and Methods, 1977
- Die Probleme der Nachweisgrenzen und Empfindlichkeiten von Lanthanoiden mit protoneninduzierter Röntgenspektralanalyse an dicken ProbenAnalytical and Bioanalytical Chemistry, 1977
- Analytical application of particle induced X-ray emissionNuclear Instruments and Methods, 1976
- New matrix effect in ion-excited x-ray elemental analysisApplied Physics Letters, 1976
- Sensitivity in Trace Element Analysis of Thick Samples Using Proton Induced X-RaysPublished by Springer Nature ,1976
- Proton induced X-ray emission as a tool for trace element analysisNuclear Instruments and Methods, 1974
- Inner-Shell Vacancy Production in Ion-Atom CollisionsReviews of Modern Physics, 1973
- Critical examination of computer programs used in quantitative electron microprobe analysisAnalytical Chemistry, 1970
- Range and stopping-power tables for heavy ionsAtomic Data and Nuclear Data Tables, 1970