Experimental determination of the strain transfer across a flexible intermediate layer in thin-film structures
- 1 January 1992
- journal article
- Published by Springer Nature in Journal of Materials Science Letters
- Vol. 11 (15) , 1067-1069
- https://doi.org/10.1007/bf00729763
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Interfacial reactions in polyimide/metal systemsJournal of Materials Research, 1991
- A review of the mechanical tests for assessment of thin‐film adhesionJournal of Vacuum Science & Technology A, 1989
- Residual stress in physically vapor deposited films: A study of deviations from elastic behaviorThin Solid Films, 1989
- Stress measurement in sputtered copper films on flexible polyimide substratesJournal of Vacuum Science & Technology A, 1987
- Residual StressPublished by Springer Nature ,1987
- States of residual stress both in films and in their substratesJournal of Vacuum Science & Technology A, 1986
- Temperature dependence of residual stress in TiC coated MoJournal of Nuclear Materials, 1984
- Interfacial reaction during metallization of cured polyimide: An XPS studyJournal of Vacuum Science & Technology A, 1984
- Measurement of stresses generated in cured polyimide filmsJournal of Vacuum Science & Technology A, 1983