Modeling and measurement of substrate coupling in Si-bipolar IC's up to 40 GHz
- 1 April 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 33 (4) , 582-591
- https://doi.org/10.1109/4.663563
Abstract
No abstract availableKeywords
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