Interface characterization of epitaxial Ag Films on Si(100) and Si(111) grown by molecular beam epitaxy
- 1 September 1990
- journal article
- symposium on-interface-science-and-engineering
- Published by Springer Nature in Metallurgical Transactions A
- Vol. 21 (9) , 2323-2332
- https://doi.org/10.1007/bf02646979
Abstract
No abstract availableKeywords
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