Role of the collecting resistive layer on the static characteristics of a 1D a-Si:H thin film position sensitive detector

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Abstract
The aim of this work is to present an analytical model able to interpret the role of the thin collecting resistive layer on the static performances exhibited by 1D amorphous silicon hydrogenated p‐i‐n thin film position sensitive detectors. The data obtained show that the devices present a linearity and a spatial resolution, of respectively, better than 99% and 20 μm for a spatial detection limit of about 80 mm, highly dependent on the characteristics exhibited by the collecting resistive layer that should have sheet resistivities in the range of 10 to 103 Ω/sq, as predicted by the model proposed.