Characterization of the annealed (0001) surface of sapphire (?-al2o3) and interaction with silver by reflection electron microscopy and scanning reflection electron microscopy
- 4 February 1992
- journal article
- research article
- Published by Wiley in Microscopy Research and Technique
- Vol. 20 (4) , 439-449
- https://doi.org/10.1002/jemt.1070200413
Abstract
No abstract availableKeywords
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