Reflection electron microscopy study of structural transformations on a clean silicon surface in sublimation, phase transition and homoepitaxy
- 1 March 1990
- journal article
- Published by Elsevier in Surface Science
- Vol. 227 (1-2) , 24-34
- https://doi.org/10.1016/0039-6028(90)90387-n
Abstract
No abstract availableThis publication has 25 references indexed in Scilit:
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