A new built-in self-test method based on prestored testing

This publication has 18 references indexed in Scilit:

• Test set embedding in a built-in self-test environment
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Aliasing errors in multiple input signature analysis registers
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Design of low cost ROM based test generators
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• A new framework for designing and analyzing BIST techniques and zero aliasing compression
  IEEE Transactions on Computers, 1991
• Cyclic code weight spectra and BIST aliasing
  Journal of Electronic Testing, 1991
• A method of reducing aliasing in a built-in self-test environment
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1991
• Optimizing error masking in BIST by output data modification
  Journal of Electronic Testing, 1990
• Comments on "Signature analysis for multiple output circuits" by R. David
  IEEE Transactions on Computers, 1990
• A Class of Test Generators for Built-In Testing
  IEEE Transactions on Computers, 1983
• Transition Count Testing of Combinational Logic Circuits
  IEEE Transactions on Computers, 1976