Cyclic code weight spectra and BIST aliasing
- 1 June 1991
- journal article
- Published by Springer Nature in Journal of Electronic Testing
- Vol. 2 (2) , 153-163
- https://doi.org/10.1007/bf00133500
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Aliasing in signature analysis testing with multiple-input shift-registersPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- A new framework for designing and analyzing BIST techniques: computation of exact aliasing probabilityPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- A new framework for designing and analyzing BIST techniques and zero aliasing compressionIEEE Transactions on Computers, 1991
- Aliasing probability for multiple input signature analyzerIEEE Transactions on Computers, 1990
- Boundary scan with built-in self-testIEEE Design & Test of Computers, 1989
- Circular self-test path: a low-cost BIST technique for VLSI circuitsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1989
- An analytical model for the aliasing probability in signature analysis testingIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1989
- Aliasing Errors in Signature in Analysis RegistersIEEE Design & Test of Computers, 1987
- Built-In Self-Test TechniquesIEEE Design & Test of Computers, 1985
- Measures of the Effectiveness of Fault Signature AnalysisIEEE Transactions on Computers, 1980