Electrical characterization of alumina layers deposited by evaporation cell on Si and restructured InP substrates
- 1 November 1997
- journal article
- Published by Elsevier in Synthetic Metals
- Vol. 90 (3) , 229-232
- https://doi.org/10.1016/s0379-6779(98)80011-8
Abstract
No abstract availableKeywords
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