In-situ X-ray measurements of relaxation processes in Si1-xGex layers on si substrate
- 16 December 1993
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 140 (2) , 421-427
- https://doi.org/10.1002/pssa.2211400212
Abstract
No abstract availableKeywords
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