Conductance technique measurements of the density of states between Si and ZnS grown by molecular beam epitaxy
- 1 July 1993
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 74 (1) , 397-401
- https://doi.org/10.1063/1.355303
Abstract
No abstract availableThis publication has 23 references indexed in Scilit:
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