Multiple weighted cellular automata
- 17 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- Calculation of multiple sets of weights for weighted random testingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A new procedure for weighted random built-in self-testPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A fault simulation method: Parallel pattern critical path tracingJournal of Electronic Testing, 1993
- TESTCHIP: a chip for weighted random pattern generation, evaluation, and test controlIEEE Journal of Solid-State Circuits, 1991
- An analytical approach to the partial scan problemJournal of Electronic Testing, 1990
- BALLAST: a methodology for partial scan designPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1989
- Group Properties of Cellular Automata and VLSI ApplicationsIEEE Transactions on Computers, 1986
- On Random Pattern Test LengthIEEE Transactions on Computers, 1984
- Statistical mechanics of cellular automataReviews of Modern Physics, 1983
- The Weighted Random Test-Pattern GeneratorIEEE Transactions on Computers, 1975