In Situ Dynamic Measurements of Sol−Gel Processed Thin Chemically Selective PDMDAAC−Silica Films by Spectroscopic Ellipsometry
- 21 July 2004
- journal article
- research article
- Published by American Chemical Society (ACS) in Chemistry of Materials
- Vol. 16 (17) , 3339-3347
- https://doi.org/10.1021/cm049709l
Abstract
No abstract availableKeywords
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