High Temperature Camera for X-Ray Topography
- 1 May 1967
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 38 (5) , 638-641
- https://doi.org/10.1063/1.1720788
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Direct X-ray observation of dislocations during annealing in aluminium single crystalsPhilosophical Magazine, 1966
- Strain in Thin Metal Films on QuartzJournal of Applied Physics, 1966
- X-Ray Extinction Contrast Topography of Silicon Strained by Thin Surface FilmsJournal of Applied Physics, 1965
- Applications of `limited projection topographs' and `direct beam topographs' in diffraction topographyBritish Journal of Applied Physics, 1963
- A study of lattice distortion by an x-ray diffraction techniqueActa Metallurgica, 1958
- Direct Observation of Individual Dislocations by X-Ray DiffractionJournal of Applied Physics, 1958
- A method for the examination of crystal sections using penetrating characteristic X radiationActa Metallurgica, 1957