The efficient simulation of coupled point defect and impurity diffusion
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 7 (2) , 191-204
- https://doi.org/10.1109/43.3149
Abstract
No abstract availableThis publication has 31 references indexed in Scilit:
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