Simulation of electrical overstress thermal failures in integrated circuits
- 1 March 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 41 (3) , 359-366
- https://doi.org/10.1109/16.275221
Abstract
No abstract availableKeywords
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- Determination of Threshold Failure Levels of Semiconductor Diodes and Transistors Due to Pulse VoltagesIEEE Transactions on Nuclear Science, 1968