A variable energy photoelectron study of the valence levels and I 4d core levels of CF3I
- 1 October 1986
- journal article
- research article
- Published by AIP Publishing in The Journal of Chemical Physics
- Vol. 85 (7) , 3840-3850
- https://doi.org/10.1063/1.450904
Abstract
Using monochromatized synchrotron radiation, gas phase photoelectron spectra of CF3I have been obtained between 21 and 100 eV photon energies. Experimental valence band branching ratios have been compared with theoretical branching ratios from MS‐Xα calculations. The generally good agreement between experiment and theory confirms the orbital assignment: 4ea1a2∼3eea1e∼2a1 a1, in order of increasing binding energy. In contrast to CF4, MS‐Xα calculations predict two shape resonances for CF3I at 15.2 eV (e channel) and 17.2 eV (a1 channel). Experimentally, weak shape resonances are observed on e orbitals at ∼14 eV kinetic energy. The cross sections are very useful for correlating orbitals in CF3I with those of CF4. For example, the cross sections suggest that the 3e orbital in CF3I correlates with the 1t1 orbital rather than the 4t2 orbital in CF4. After the onset of the I 4d level at ∼57 eV, intershell coupling becomes important in enhancing valence band levels having high I 5p character such as the 4e orbital. The I 4d branching ratio from 66 to 110 eV is similar to the Xe 4d branching ratio in atomic Xe, indicating atomic‐like behavior for the I 4d subshell.Keywords
This publication has 41 references indexed in Scilit:
- Shape resonances in the photoionization of CF4The Journal of Chemical Physics, 1986
- Photoelectron study of the valence level cross sections of XeF2 from 21 to 50 eV photon energyThe Journal of Chemical Physics, 1986
- Angle-resolved photoelectron spectroscopy of the valence orbitals of SiCl4 as a function of photon energy from 14 to 80 eVThe Journal of Chemical Physics, 1986
- Shape resonances in the angle-resolved photoelectron spectroscopy of the Si 2p shell of SiCl4The Journal of Chemical Physics, 1986
- Shape resonances above the Si 2p threshold in SiF4The Journal of Chemical Physics, 1986
- Theoretical approach to the cooper minimum in hydrogen iodideChemical Physics Letters, 1986
- Photoelectron study of the valence levels of CF4 and SiF4 from 20 to 100 eVThe Journal of Chemical Physics, 1985
- High-resolution gas-phase photoelectron spectra using synchrotron radiation: Xe 4dlinewidths and the 4:4branching ratioPhysical Review A, 1985
- Angle-resolved photoelectron cross section of CF4The Journal of Chemical Physics, 1984
- Angle resolved photoelectron spectroscopy of the valence shells in HI and CH3I as a function of photon energy from 13 to 90 eVThe Journal of Chemical Physics, 1984