Hydrogen evolution and defect creation in amorphous Si: H alloys
- 15 December 1979
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 20 (12) , 4839-4846
- https://doi.org/10.1103/physrevb.20.4839
Abstract
Changes in the composition and electronic properties of plasma-deposited -Si: H after annealing at temperatures through 600° C are studied by ESR, luminescence, infrared spectroscopy and hydrogen evolution. The generation of paramagnetic defects in -Si: H on annealing is found to depend only on the amount of hydrogen evolved. The relation of peaks in the hydrogen-evolution rate to specific local hydrogen-bonding environments is studied and shown to be dominated by the effects of diffusion and sample microstructure.
Keywords
This publication has 12 references indexed in Scilit:
- Kinetics of decomposition of amorphous hydrogenated silicon filmsJournal of Applied Physics, 1979
- Microstructure of plasma-deposited a-Si : H filmsApplied Physics Letters, 1979
- Recombination in plasma-deposited amorphous Si:H. Luminescence decayPhysical Review B, 1979
- Effect of annealing on the optical properties of plasma deposited amorphous hydrogenated siliconSolar Energy Materials, 1979
- Luminescence studies of plasma-deposited hydrogenated siliconPhysical Review B, 1978
- A SIMS analysis of deuterium diffusion in hydrogenated amorphous siliconApplied Physics Letters, 1978
- Luminescence decay in glow-discharge deposited amorphous siliconPhilosophical Magazine Part B, 1978
- Hydrogen bonding in silicon-hydrogen alloysPhilosophical Magazine Part B, 1978
- Infrared and Raman spectra of the silicon-hydrogen bonds in amorphous silicon prepared by glow discharge and sputteringPhysical Review B, 1977
- Quantitative analysis of hydrogen in glow discharge amorphous siliconApplied Physics Letters, 1977