Identification of theheteroantisite defect in GaAs:Bi
- 15 August 1993
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 48 (7) , 4437-4441
- https://doi.org/10.1103/physrevb.48.4437
Abstract
GaAs lightly doped with the heaviest group-V atom, bismuth (Bi), has been studied by conventional electron-spin resonance (ESR) and by ESR detected via the magnetic-circular-dichroism (MCD) absorption. A new Bi-related sharp-line MCD band has been observed on which two MCD-ESR lines have been discovered. They are shown to arise from the singly ionized double donor. Most remarkably, a substantial fraction, about 10%, of the total Bi content is found to occupy the Ga site. The MCD absorption band is tentatively assigned to an exciton deeply bound to the singly ionized double donor .
Keywords
This publication has 19 references indexed in Scilit:
- Antisite-related defects in bulk GaAs1-xPxsingle crystalsSemiconductor Science and Technology, 1992
- Electronic properties of theheteroantisite defect in GaAs:SbPhysical Review B, 1991
- Magneto-optical investigation of iron in InP, GaAs and GaPSemiconductor Science and Technology, 1991
- Electron paramagnetic resonance identification of theheteroantisite defect in GaAs:SbPhysical Review B, 1989
- Magnetic circular dichroism investigations of Fe3+ions in InP crystalsSemiconductor Science and Technology, 1989
- Optical Properties of As-Antisite andDefects in GaAsPhysical Review Letters, 1984
- Electron paramagnetic resonance spectra of the Group 4 hexafluoride anion radicalsThe Journal of Physical Chemistry, 1978
- ESR detection of antisite lattice defects in GaP, CdSiP2, and ZnGeP2Applied Physics Letters, 1976
- Simple Theoretical Estimates of the Enthalpy of Antistructure Pair Formation and Virtual‐Enthalpies of Isolated Antisite Defects in Zinc‐Blende and Wurtzite Type SemiconductorsJournal of the Electrochemical Society, 1975
- Measurement of Nuclear SpinPhysical Review B, 1931