Channeling Contrast Microscopy: A Powerful Tool for Examining Semiconductor Structures
- 1 January 1986
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Diffusion and precipitation in amorphous SiApplied Physics Letters, 1985
- MeV Helium Microbeam Analysis: Applications to Semiconductor StructuresMRS Proceedings, 1985
- Kinetics and Mechanisms of Solid Phase Epitaxy and Competitive Processes in SiliconMRS Proceedings, 1984
- Channeling contrast microscopy: Application to semiconductor structuresApplied Physics Letters, 1983
- Substitutional solid solubility limits during solid phase epitaxy of ion implanted (100) siliconApplied Physics Letters, 1982