Anatomy of an in-flight anomaly: investigation of proton-induced SEE test results for stacked IBM DRAMs
- 1 December 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 45 (6) , 2898-2903
- https://doi.org/10.1109/23.736545
Abstract
We present ground test and space flight data describing a single event anomaly that affects multiple bytes in a stacked DRAM module. A 12 Gbit solid state recorder containing 1,440 DRAM die experiences the anomalous events at a rate requiring testing of a large sample set of these modules.Keywords
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