Design of matching test structures [IC components]
- 17 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Process dependence on two-capacitor matching properties with different etching techniqueIEEE Transactions on Electron Devices, 1992
- On the relationship between topography and transistor matching in an analog CMOS technologyIEEE Transactions on Electron Devices, 1992
- Mismatch drift: a reliability issue for analog MOS circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1992
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- Using spatial information to analyze correlations between test structure data (semiconductor IC manufacture)IEEE Transactions on Semiconductor Manufacturing, 1991
- Matching properties of MOS transistorsIEEE Journal of Solid-State Circuits, 1989
- Matching properties of linear MOS capacitorsSolid-State Electronics, 1989