Formation of interstitial-type dislocation loops in tetrahedral semiconductors by precipitation of vacancies
- 15 April 1978
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 17 (8) , 3197-3206
- https://doi.org/10.1103/physrevb.17.3197
Abstract
It is hypothesized that when vacancies precipitate to form voids in tetrahedral semiconductors, e.g., Si and GaAs, reconstruction reactions occur on the internal surfaces of these voids in the same manner as they are observed to occur on external surfaces of the same crystallographic orientation. Previously, it has been concluded that many of the various reconstruction reactions observed on various semiconductor surfaces produce hillocks by expelling a portion of the atoms from the unreconstructed (ideal) surface to migrate in a reaction front across the surface. From these two lemmas, it is here concluded that the corresponding waves of atoms driven by reconstruction on internal surfaces will precipitate into pillars of crystal-line material within the void and produce dislocation loops at which the lattice planes bow away from the center. Such dislocations are conventionally denoted "interstitial type." This mechanism may explain several observations of "interstitial type" dislocations in semiconductors, including Si and GaAs, for which there is much evidence for vacancies and no other evidence for self-interstitials.Keywords
This publication has 56 references indexed in Scilit:
- A Quantitative Model for the Diffusion of Phosphorus in Silicon and the Emitter Dip EffectJournal of the Electrochemical Society, 1977
- Defects in silicon substratesJournal of Vacuum Science and Technology, 1977
- A comment on the “characterization of swirl defects in floating zone Si crystals” by P.M. Petroff and A.J.R. De KockJournal of Crystal Growth, 1976
- Injection-stimulated dislocation motion in semiconductorsApplied Physics Letters, 1976
- On the nucleation of precipitate colonies from swirl defects in siliconPhysica Status Solidi (a), 1976
- Formation and nature of swirl defects in siliconApplied Physics A, 1975
- Microscopic Mechanisms of Growth of Dark Line Defects in Double Heterostructure LasersJournal of the Electrochemical Society, 1975
- Characterization of swirl defects in floating-zone silicon crystalsJournal of Crystal Growth, 1975
- Degradation in injection lasersIEEE Journal of Quantum Electronics, 1975
- Transmission electron microscope investigation of the growth of copper precipitate colonies in siliconJournal of Applied Physics, 1973