Surface quantization effect on the macroscopic characteristics of semiconductor space-charge layers
- 1 November 1984
- journal article
- Published by Elsevier in Surface Science
- Vol. 147 (1) , 329-342
- https://doi.org/10.1016/0039-6028(84)90184-5
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Static technique for precise measurements of surface potential and interface state density in MOS structuresApplied Physics Letters, 1975
- Properties of Semiconductor Surface Inversion Layers in the Electric Quantum LimitPhysical Review B, 1967