Electrical properties of semiconductor surfaces
- 1 March 1983
- journal article
- Published by Springer Nature in Applied Physics A
- Vol. 30 (3) , 127-145
- https://doi.org/10.1007/bf00620532
Abstract
No abstract availableKeywords
This publication has 100 references indexed in Scilit:
- LEED studies of surface imperfectionsApplications of Surface Science, 1982
- Automated system for the characterization of high resistivity semiconductors by the van der Pauw methodReview of Scientific Instruments, 1981
- Dependence of electron mobility on spatial separation of electrons and donors in AlxGa1−xAs/GaAs heterostructuresJournal of Applied Physics, 1981
- Generalized Hall-effect measurement geometries and limitations of van der Pauw-type Hall-effect measurementsJournal of Applied Physics, 1981
- Mobility of Electrons in a Quantized Accumulation Layer on ZnO Limited by Phonon ScatteringPhysica Status Solidi (b), 1980
- Rapid, pulse counting low-energy electron diffraction instrumentReview of Scientific Instruments, 1980
- Effects of nitrogen annealing on electron scatterings in SiSiO2 interfaceSolid-State Electronics, 1979
- Energy Structure in Photoelectric Emission from Cs-Covered Silicon and GermaniumPhysical Review B, 1966
- Leitfähigkeitsänderungen dünner Zinkoxyd-Schichten durch ElektronenbestrahlungThe European Physical Journal A, 1952
- Contact Potential Difference in Silicon Crystal RectifiersPhysical Review B, 1947