The effect of circuit topology on radiation-induced latchup
- 1 December 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 36 (6) , 2229-2238
- https://doi.org/10.1109/23.45429
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
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