Lifetime and drift velocity analysis for electromigration in sputtered Al films, multilayers, and alloys
- 31 October 1983
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 26 (10) , 1023-1032
- https://doi.org/10.1016/0038-1101(83)90080-1
Abstract
No abstract availableKeywords
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