High-field electron transport in InxGa1−xAsyP1−yg =1.2 μm)

Abstract
A fixed‐frequency microwave time‐of‐flight technique has been used to measure electron drift velocities in Inx Ga1−x Asy P1−yg =1.2 μm) at temperatures 95–400 K and electric field strengths of up to 200 kV/cm. The room‐temperature electron drift velocity in the quaternary is equal to the velocity in GaAs for field strengths greater than ∼62 kV/cm, but the velocity is higher in the quaternary for field strengths from about 20–62 kV/cm at 300 K. At temperatures above 300 K the high‐field velocity is larger in the quaternary than in GaAs, but below 300 K the high‐field velocity is larger in GaAs.