Field influence on deep level transients at large deep to shallow trap ratios
- 15 December 1984
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 45 (12) , 1317-1319
- https://doi.org/10.1063/1.95133
Abstract
The differential capacitance method is used to determine the enhancement of thermal emission rates by electric field. The customary analysis is modified for large ratios of deep and shallow trap concentrations. Experimental results are given for the DX center in AlxGa1−xAs at x=0.55.Keywords
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