Characterization of PbTiO3 thin films deposited on Pt/Ti/SiO2/Si substrates by ECR PECVD
- 1 February 1995
- journal article
- Published by Springer Nature in Journal of Materials Research
- Vol. 10 (2) , 447-452
- https://doi.org/10.1557/jmr.1995.0447
Abstract
No abstract availableKeywords
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