Microwave Propagation in Semiconductors with Carrier Density Varying in Time
- 1 November 1962
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IRE Transactions on Microwave Theory and Techniques
- Vol. 10 (6) , 564-567
- https://doi.org/10.1109/tmtt.1962.1125568
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Measurement of Lifetime of Carriers in Semiconductors through Microwave ReflectionJournal of Applied Physics, 1962
- Microwave Measurement of Semiconductor Carrier LifetimesJournal of Applied Physics, 1960
- Microwave Techniques in Measurement of Lifetime in GermaniumJournal of Applied Physics, 1959
- Microwave Observation of the Collision Frequency of Holes in GermaniumPhysical Review B, 1953
- Microwave Observation of the Collision Frequency of Electrons in GermaniumPhysical Review B, 1953