Dynamic test signal design for analog ICs
- 19 November 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Fault Detection And Input Stimulus Determination For The Testing Of Analog Integrated Circuits Based On Power-supply Current MonitoringPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Fault-based automatic test generator for linear analog circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Designs for Computer ExperimentsTechnometrics, 1989
- Detection of catastrophic faults in analog integrated circuitsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1989